KLA-TENCOR LTD.

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KLA-TENCOR LTD.

Gedetailleerde beschrijving:

KLA Tencor offers the industry's widest range of best of breed inspection and metrology tools combined with industry leading process control expertise and best practices know how

Trefwoorden:

wafer, reticle, spectroscopic ellipsometry, fab wide, mask, metrology, wafer defects, yield, inspection, stress, copper, cops, data, wafer inspection, film, sem, management, laser confocal review, etch, analysis, measurement, shrinks, semiconductor measurement, defects, reticle inspection, profiling, resistivity, damascene, surface, kla, software, laser confocal, tencor